LBTEK-Beam Profiler

Product Description

Spectral coverage from 190 to 1750 nm, compatible with ultraviolet, visible, and near-infrared bands.
High-resolution image, 4096 × 3072 @ 3.2 μm, capturing fine beam profile details.
Integrated magnetic ND filter kit with tilted design to prevent interference fringes.
Windowing treatment of the photosensitive chip to avoid introducing extra noise.
Software can calculate spot size, M² factor, divergence angle, directivity, and a full range of other beam metrics.

A Beam Profilert is a core diagnostic tool for characterizing the spatial characteristics of laser beams. It can precisely quantify parameters such as spot morphology, energy distribution, and divergence angle, and serves as fundamental equipment for laser tuning, optical systems assembly and alignment, quantum light source optical path coupling, and performance verification. The LBTEK Beam Profiler consists of a high-resolution area-array CMOS detector and attenuation modules. Equipped with a high-precision photosensitive chip, the detector outputs high-quality raw spot data through two-dimensional intensity sampling and low-noise analog-to-digital conversion. Combined with a variety of attenuation modules, it effectively avoids the risk of detector saturation and accommodates laser measurements across different power levels. The supporting software, developed in accordance with ISO 11146 standard algorithms, calculates parameters such as spot size, centroid position, ellipticity, divergence angle, M² factor, and Pointing Stability in real time, and presents them intuitively in pseudo-color images. The software supports quick configuration of exposure time, gain, and ROI regions, and provides data logging functionality for easy traceability of the measurement process and reproducibility of results.

Diagram

Beam Profiler, 190 - 1100 nm

The wavelength range covers 190 - 1100 nm.
Multi-resolution configuration, accommodating both micro-spot and large-spot measurements.
Sensor chip windowing treatment to avoid introducing additional noise.
USB3.0 high-speed interface, stable and efficient data transmission
Standard attenuator, with a maximum tolerance of 1W power and 1J/cm² energy density.

The LBTEK 190–1100 nm Beam Profiler is built for scientific research and industrial laser measurement scenarios. It is used for online monitoring and quantitative measurement of focused and Collimated Light spots from Optical Fiber and semiconductor lasers within 1W. This product series offers multiple resolution and photosensitive target surface configurations. The 4096 × 3072 pixel model is equipped with a 3.2 μm micro-pixel sensor, enabling high-precision analysis of micro-spots; combined with the full-series gradient target surface sizes, it covers a spot measurement range of 32 μm to 15.8 mm. The photosensitive chip adopts a windowing process to suppress extraneous noise and ensure the sampling signal-to-noise ratio. The device is standard-equipped with a USB3.0 high-speed interface for stable and efficient data transmission. Magnetic-mount attenuator kits are included as standard configuration, allowing attenuation levels to be matched according to incoming light intensity to prevent Detectors from saturation and damage, thus meeting various beam quality assessment and spot profile analysis requirements.

Rear interface diagram

Product Model	Pixel size	Operating Wavelength	Beam Detection Range	Unit Price	Lead Time
BMS0340-VISNIR New	3.2 μm	340 - 1100 nm	32 μm - 9.8 mm	$4,837.42	4 weeks	Add Cart
BMS0324-UVISNIR New	3.45 μm	190 - 1100 nm	34.5 μm - 7.1 mm	$3,268.53	4 weeks	Add Cart
BMS0632-VISNIR New	6.4 μm	340 - 1100 nm	64 μm - 15.8 mm	$6,798.54	4 weeks	Add Cart
BMS-FIL-UVP New	UV Filter Kit	190 - 340 nm	UV Filter Kit	$522.96	3 weeks	Add Cart

Beam Profiler, 900 - 1750 nm

Wavelength range: 900 - 1750 nm
Spot detection range 50 μm - 5.1 mm
Windowing treatment of the photosensitive chip to avoid introducing additional noise
GigE industrial interface, supporting long-distance transmission
Standard filter, with maximum tolerance of 1W power and 1J/cm² energy density

LBTEK 900 - 1750 nm Beam Profiler is adapted to infrared beam measurement scenarios such as optical fiber lasers, LiDAR, and optical communication light sources. The BMS0512-IR features a 1280 × 1024 resolution with a 5 μm pixel sensor, covering a spot measurement range of 50 μm to 5.1 mm. The photosensitive chip undergoes windowing treatment to suppress additional noise and ensure sampling accuracy. It is equipped with a GigE gigabit industrial Ethernet port, supporting long-distance transmission and suiting complex industrial environments. The magnetic attenuation filter kit is a standard configuration, withstanding up to 1 W power and 1 J/cm² energy density. The adjustable frame rate of 2 - 10 fps takes image quality into account, balancing imaging quality against backend computation and storage pressure, meeting the various laser beam characterization needs of this wavelength band.

Back Interface Diagram

	Product Model	Pixel size	Operating Wavelength	Beam Detection Range	File	Unit Price	Compare	Lead Time
	BMS0512-IR New	5 μm	900 - 1750 nm	50 μm - 5.1 mm		$15,688.94		4 weeks	Add Cart