LBTEK-Optical Surface Defect (Scratch-Dig) Comparison Plate

Product Description

Visual scratch-dig reference for Optical Components inspection
OSIP-ISO：ISO 10110-7
OSIP-MILB：MIL-PRF-13830B for dig numbers 5 to 50, ANSI/OEOSC OP1.002 for all digs and scratches
With plastic frame，includes hard foam box

LBTEK Scratch-Dig Comparison Plates (OSIP-ISO, OSIP-MILB) are used for the evaluation of surface quality of Optical Components, determining the defect level of component surfaces by visual inspection or comparison under a Microscope. The product offers two types of comparison plates, based on different evaluation standards, covering the two common surface quality systems of ISO and MIL. When using the comparison plate, place it beside the Optical Component to be inspected, and compare the surface defects of the Optical Component with the defects on the comparison plate. Both of our comparison plates are designed for size analysis, which helps in the impartial identification of defects on Optical Components. It is recommended that manufacturers and users use the same standard.

Optical Surface Defect (Scratch-Dig) Comparison Plate

Visible Scratch-Dig Reference for Optical Components Inspection
OSIP-ISO: ISO 10110-7
OSIP-MILB: MIL-PRF-13830B for dig numbers 5 to 50, ANSI/OEOSC OP1.002 for all digs and scratches
With plastic frame, includes hard foam case.

OSIP-ISO comparison plate: Defined in accordance with ISO 10110-7 standard. Defects are evaluated and graded by physical size, without distinguishing scratches from digs; all imperfections are treated as scratches of varying sizes. This plate emphasizes dimensional quantification and is suitable for scenarios where surface quality is judged using the ISO system.

OSIP-MILB comparison plate: Defines scratches and digs in accordance with ANSI/OEOSC OP1.002 standard, with dig numbers 5–50 corresponding to MIL-PRF-13830B standard. The plate is divided into scratches and digs according to defect shape, highlighting the morphological differences of defects. The grade number represents scratch width (in µm) or dig diameter (in 1/100 mm), enabling direct comparison and grading against established thresholds.

Details of OSIP-ISO (Top) and OSIP-MILB (Bottom) Surface Defect Standards

	Product Model	Range of products	Unit Price	Compare	Lead Time
	OSIP-ISO New	Scratch range: 0.016 - 0.63	$494.75		today	Add Cart
	OSIP-MILB New	Scratch range: 5 - 120 , Dig range: 5 - 100	$494.75		today	Add Cart