The Michelson interferometer teaching device is a high-precision optical measurement instrument designed based on the Michelson interference principle, utilizing the amplitude-splitting method to generate two-beam interference. It is widely used in various fields, including optical engineering, materials science, semiconductor manufacturing, etc., for measuring parameters such as reflection, transmission, and surface topography of optical components. The goal of this experimental project is to familiarize students with the interferometer as a highly sensitive measurement instrument. Due to its extensive applications in technology and industry, this kit is designed with multiple experiments aimed at demonstrating measurement methods for different physical properties.
This experiment enhances students' hands-on abilities by assembling a Michelson interferometer themselves. Using the interferometer for practical measurements helps students deepen their understanding of the fundamental principles of the Michelson interferometer while learning and mastering the principles and methods of interferometric measurement.
Diagram
Michelson Interferometer Teaching Device
Interference Demonstration Prediction Measurement
Refractive Index Measurement
Thermal Expansion Coefficient Measurement
LBTEK's Michelson Interferometer Teaching Kit allows students to construct a basic Michelson interferometer and use this system to measure the physical properties of laser sources and other materials. The kit includes all components necessary to build a functional interferometer, including a light source, mirrors, beam splitter cube, and viewing screen; it also contains components required for measurement experiments, including an LED light source, transparent acrylic plate, heater, and mechanical supports.
Interference Image Changes with Different Optical Path Differences in Two Interferometer Arms
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Michelson Interferometer Setup and Material Physical Property Measurement Experimental Apparatus