LBTEK-Wavefront sensor

Product Description

Absolute accuracy <5 nm
Sensitivity <2 nm
Microlens array 128×128

LBTEK wavefront sensors utilize a high-precision 128×128 microlens array to split the incident beam into multiple sub-apertures, focusing them onto a high-resolution detector. By precisely calculating the displacement of each focused spot relative to its ideal position, the complete wavefront phase distribution of the incident light can be reconstructed in real-time. This enables quantitative analysis of key information such as aberrations, curvature, and distortion. They are widely used in fields such as optical system alignment and testing, laser beam quality analysis, and optical surface and component testing. Furthermore, LBTEK offers flexible customization services based on specific application requirements. For details, please consult our customer service.

Wavefront sensor

Working Wavelength 400-1100 nm
Detector Resolution 2048×2048
Dynamic Range (PV) >50 μm

The SHWFS-128 wavefront sensor, when paired with the translation stage AS60-PY, can precisely calculate the offset of each focused light spot relative to its ideal position. This allows for the real-time reconstruction of the complete wavefront phase distribution of the incident light wave, enabling quantitative analysis of key information such as its aberrations, curvature, and distortion. The measurement accuracy is highest when the incident beam has good temporal coherence and its diameter covers a sufficient number of microlens sub-apertures. It is important to note that the intensity of the incident beam should be within the linear response range to avoid camera saturation, and the spatial frequency of the wavefront distortion should not exceed the sampling capability of the microlens array.

Wavefront Sensor + Adapter Plate + Translation Stage Assembly

	Product Model	Absolute Precision	Dynamic Range	Resolution	Unit Price	Compare	Lead Time
	SHWFS-128 New	<5 nm	>50 μm	2048×2048	Contact		Contact	Add Cart