LBTEK-Your Trusted Partner For Optoelectronic Experiments!

Product Description

Real-time beam characterization
Suitable for continuous or pulsed lasers
Visible, UV, and near-IR wavelength options available
Neutral density filter options provided
Enhanced background and hot pixel processing for optimal dynamics and signal-to-noise ratio

LBTEK's Beam Profiler features a user-friendly human-machine interface simple to operate, enabling comprehensive analysis and statistics for laser beams. The BeamPro software, with the standard communication protocols, allowing control of multiple BeamPro software instances via PC. These Beam Profilers are suitable for beams with wavelengths ranging from 375 nm to 1100 nm or 190 nm to 1100 nm, with a maximum spot size of 25 mm. They offer various detection areas, pixel sizes, resolutions, and exposure times as short as microseconds, meeting diverse application requirements. The system supports multiple parameters and methods (including ISO calculations), client/server interfaces, and network remote control. The integrated power meter within the beam quality analyzer can be user-calibrated, eliminating the need for external power meters while achieving optimal synchronization and optimization of power and beam shape. To compensate for ambient light, the average measured ambient light intensity is subtracted from the beam profile measurements. Automatic exposure and gain control functions enable the camera to better adapt to actual beam intensity for improved imaging quality. Each Beam Profiler is eqquiped with the BeamPro software package.

Attribute

Sensor TypeCMOS 12 bit

PC InterfaceUSB 3.1

Optical InterfaceC-Mount

Beam Profilers, CMOS Camera Type

Sensor Type: CMOS 12 bit
Resolution: Up to 4508×4096
Minimum Single Pixel Size: 2.5 µm×2.5 µm
C-Mount Optical Interface

The LBTEK Beam Profiler features a user-friendly human-machine interface that is simple and easy to operate. With various working wavelengths, detection areas, pixel sizes, and resolutions, it can meet diverse application requirements of customers. Supporting multiple parameters and methods (including ISO calculations), client/server interfaces, and network remote control, its automatic exposure and gain control functions enable the camera to better adapt to actual beam intensity for superior imaging quality. The Beam Profiler is shipped with the BeamPro software package.

Measured spot size diagram

Product Model	Operating Wavelength	Minimum beam diameter	Detection area	Unit Price	Lead Time
BP6.5	375 nm-1100 nm	12 μm	6.5 mm×5.4 mm	Contact	Contact
BP6.5-UV2	190 nm-1100 nm	12 μm	6.5 mm×5.4 mm	Contact	Contact
BP11.10	375nm-1100nm	12 μm	11.3 mm×10.2 mm	Contact	Contact
BP11.10-UV2	190nm-1100nm	12 μm	11.3 mm×10.2 mm	Contact	Contact
BP11.11	375nm-1100nm	29 μm	11.2 mm×11.2 mm	Contact	Contact
BP11.11-UV2	190nm-1100nm	29 μm	11.2 mm×11.2 mm	Contact	Contact
BP Phi25	375 nm-1100 nm	102 μm	25 mm×25 mm	Contact	Contact

Wafer-Style Beam Profilers, CMOS Camera Type

Sensor Type: CMOS 12 bit
Resolution: Up to 3864 x 2176
Minimum Pixel Size: 1.45 µm×1.45 µm
C-Mount Optical Interface
Compact Structure, Maximum Thickness 10 mm

The Wafer-Style Beam Profiler features a user-friendly human-machine interface that is simple and easy to operate. It offers various working wavelengths, detection areas, pixel sizes, and resolutions to meet different application requirements of customers. With its wafer-style structure, it boasts a compact form factor. It supports multiple parameters and methods (including ISO calculations), client/server interfaces, and network remote control. The automatic exposure and gain control functions enable the camera to better adapt to actual beam intensity for improved imaging quality. The beam prolifier comes with the BeamPro software package upon shipment.

Measured spot size diagram

Product Model	Operating Wavelength	Minimum beam diameter	Detection area	Unit Price	Lead Time
µ-BP6.3+	375 nm-1100 nm	7 μm	5.6 mm×3.2 mm	Contact	Contact
µ-BP6.3+-UV2	190 nm-1100 nm	7 μm	5.6 mm×3.2 mm	Contact	Contact
µ-BP7.4	375 nm-1100 nm	17 μm	6.6 mm×4.2 mm	Contact	Contact
µ-BP7.4-UV2	190 nm-1100 nm	17 μm	6.6 mm×4.2 mm	Contact	Contact