LBTEK's concentric circle and crosshair grid target consists of 289 independent grids arranged in 17 rows and 17 columns, with the 289 grids uniformly distributed within a central 50.8×50.8 mm area. Each grid is composed of four concentric circle patterns of different sizes and five crosshair patterns, with each concentric circle pattern featuring seven different radii, and each crosshair pattern containing one or two crosses. The LBTEK concentric circle and crosshair grid target can be used to measure system resolution, distortion, and magnification. The resolution test target includes both positive (bright field) and negative (dark field) resolution test targets. The positive resolution test target is created by depositing chromium on a soda-lime glass substrate, allowing light to pass through the non-patterned areas. The negative resolution test target, on the other hand, is made by depositing chromium on the substrate to allow light transmission through the patterned areas. For other customization requirements, please contact technical support.

The LBTEK RTR1Ee test target is a combination test target suitable for various tests, including a 1951 USAF pattern (groups 2 to 7), a star pattern, a concentric circle pattern, three grid patterns (100 µm, 50 µm, and 10 µm), and Ronchi rulings (30 to 150 lp/mm). It can be used to evaluate the imaging quality of imaging systems (resolution, field curvature, focus error, astigmatism, image distortion, etc.). The resolution test target includes positive (bright field) and negative (dark field) resolution test targets. The positive resolution test target is chrome-plated on a soda-lime glass substrate, allowing light to pass through the non-patterned areas. The negative resolution test target is chrome-plated on the substrate, allowing light to pass through the patterned areas. For other customization requirements, please contact Technical Support.