The LBTEK RTR1Ee test target is a combination test target suitable for various tests, including a 1951 USAF pattern (groups 2 to 7), a star pattern, a concentric circle pattern, three grid patterns (100 µm, 50 µm, and 10 µm), and Ronchi rulings (30 to 150 lp/mm). It can be used to evaluate the imaging quality of imaging systems (resolution, field curvature, focus error, astigmatism, image distortion, etc.). The resolution test target includes positive (bright field) and negative (dark field) resolution test targets. The positive resolution test target is chrome-plated on a soda-lime glass substrate, allowing light to pass through the non-patterned areas. The negative resolution test target is chrome-plated on the substrate, allowing light to pass through the patterned areas. For other customization requirements, please contact technical support.
Product Model | Diameter | Resolution | Coating | Unit Price | Compare | Lead Time | ||
---|---|---|---|---|---|---|---|---|
RTR1CI-N | 25.4 mm | 115 lp/mm | Chrome (test pattern transparent, other areas coated) | $213.5 | 2 weeks | |||
RTR1CH-N | 25.4 mm | 57.5 lp/mm | Chrome (test pattern transparent, other areas coated) | $145.25 | 2 weeks | |||
RTR1CH-P | 25.4 mm | 57.5 lp/mm | Chrome (test pattern coating) | $157.67 | 2 weeks | |||
RTR1CI-P | 25.4 mm | 115 lp/mm | Chrome (test pattern coating) | $167.48 | 2 weeks |