SIM Super-Resolution Fluorescence Imaging Systems

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Product Description
  • Structured light illumination imaging, high spatiotemporal resolution
  • Compact structure, modular design
  • High cost-performance ratio
  • Customization accepted, rapid response, full-service support, flexible configuration, quality assurance
Structured Illumination Microscopy (SIM) is a fluorescence microscopic imaging technology characterized by low phototoxicity, high temporal resolution, and high spatial resolution. Based on the principle of optical transfer function extension, it can break the diffraction limit of traditional fluorescence microscopy and achieve a two-fold improvement in resolution. As a super-resolution imaging technique, SIM provides a better balance between temporal and spatial resolution. Moreover, SIM has no special requirements for fluorescent probes, making it widely applicable in biomedical research fields such as live-cell imaging.
SIM Super-Resolution Fluorescence Imaging Systems
  • Laser light source options: 405 nm/488 nm/561 nm/640 nm
  • Lateral resolution surpasses the optical diffraction limit
  • Imaging speed: 200-0.1 fps
  • The system needs to be fixed on a vibration-isolated optical platform; recommended platforms are available for purchase below

The LBTEK SIM-FL-300 Super-Resolution Fluorescence Microscopy Imaging System features a compact design, with all components mounted on a single breadboard for easy portability and minimal space occupation, making it suitable for applications in confined spaces. The integration of hardware control software and strict timing synchronization enables fast and efficient image acquisition. The highly integrated and user-friendly software interface allows parameter configuration and image capture via a PC. Equipped with a passive polarization control module, the system achieves a polarization extinction ratio exceeding 40:1 at the back focal plane of the objective without compromising temporal resolution, delivering a fringe modulation contrast-to-noise ratio (MCNR) of over 4.0 in raw images. Utilizing a high-speed sCMOS scientific camera and a digital micromirror device (DMD), combined with high-resolution objectives, the system offers a temporal resolution of 5 ms for super-resolution imaging and a lateral spatial resolution of 140 nm. The integration of a three-axis stainless steel translation stage and a piezoelectric stage ensures smooth coarse and fine focus adjustments while enabling precise sample positioning. The SIM-FL-300 boasts high scalability and cost-effectiveness, making it suitable for both routine experimental research and super-resolution fluorescence microscopy teaching applications. For customers requiring complete system procurement, LBTEK provides comprehensive and tailored customization services, including TIRF-SIM, Multi-color SIM, and 3D-SIM. For customization inquiries, please contact LBTEK Technical Support.

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Laser light source
Imaging speed
Horizontal resolution
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Lead Time
SIM-FL-300 Standard: 561 nm; Optional: 405 nm/488 nm/640 nm200-0.1 fps140 nm@561 nmContactContact
SIM-FL-300-SC Standard: 561 nm; Optional: 405 nm/488 nm/640 nm200-0.1 fps140 nm@561 nmContactContact
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